عنوان
پدید آورنده
موضوع
رده
TK7871.85 .P426 1993
TK7871
.
85
.
P426
1993
کتابخانه
محل استقرار
شابک
شابک
0125507704
شابک
9780125507707
شماره کتابشناسی ملی
شماره
dltt
عنوان و نام پديدآور
عنوان اصلي
Optical characterization of semiconductors :
نام عام مواد
[Book]
ساير اطلاعات عنواني
infrared, Raman, and photoluminescence spectroscopy /
نام نخستين پديدآور
Sidney Perkowitz
مشخصات ظاهری
نام خاص و کميت اثر
x, 220 pages :
ساير جزييات
illustrations ;
ابعاد
25 cm
فروست
عنوان فروست
Techniques of physics ;
مشخصه جلد
14
یادداشتهای مربوط به کتابنامه ، واژه نامه و نمایه های داخل اثر
متن يادداشت
Includes bibliographical references (pages 207-215) and index
یادداشتهای مربوط به مندرجات
متن يادداشت
1. Introduction -- 2. Optical Theory for Semiconductor Characterization -- 3. Optical Physics of Semiconductors -- 4. Measurement Methods -- 5. Case Studies: Photoluminescence Characterization -- 6. Case Studies: Raman Characterization -- 7. Case Studies: Infrared Characterization -- 8. Summary and Future Trends
بدون عنوان
2
یادداشتهای مربوط به خلاصه یا چکیده
متن يادداشت
Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods
متن يادداشت
For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time
متن يادداشت
Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience
متن يادداشت
There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering
متن يادداشت
Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors
متن يادداشت
Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique
ویراست دیگر از اثر در قالب دیگر رسانه
عنوان
Optical characterization of semiconductors.
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Semiconductors-- Testing-- Optical methods
رده بندی ديویی
شماره
621
.
3815/2/0287
ويراست
20
رده بندی کنگره
شماره رده
TK7871
.
85
نشانه اثر
.
P426
1993
نام شخص به منزله سر شناسه - (مسئولیت معنوی درجه اول )
مستند نام اشخاص تاييد نشده
Perkowitz, Sidney
مبدا اصلی
تاريخ عمليات
20160712055312.0
دسترسی و محل الکترونیکی
نام الکترونيکي
مطالعه متن کتاب اطلاعات رکورد کتابشناسی
نوع ماده
[Book]
اطلاعات دسترسی رکورد
تكميل شده
Y
