Introduction -- Principles of NC-AFM -- Semiconductor Surfaces -- Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductors -- Alkali Halides -- Atomic Resolution Imaging on Fluorides -- Atomically Resolved Imaging of a NiO(001) Surface -- Atomic Structure, Order and Disorder of High-Temperature Reconstructed alpha-Al2O3(0001) -- NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides -- Atoms and Molecules on TiO2(110) and CeO2(111) Surfaces-. NC-AFM Imaging of Adsorbed Molecules -- Organic Molecular Films -- Single-Molecule Analysis -- Low-Temperature Measurements: Principles, Instrumentation, and Application -- Theory of NC-AFM -- Chemical Interaction in NC-AFM on Semiconductor Surfaces -- Contrast Mechanisms on Insulating Surfaces -- Analysis of Microscopy and Spectroscopy Experiments -- Theory of Energy Dissipation into Surface Vibrations -- Measurement of Dissipation Induced by Tip-Sample Interactions.
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یادداشتهای مربوط به خلاصه یا چکیده
متن يادداشت
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
ویراست دیگر از اثر در قالب دیگر رسانه
شماره استاندارد بين المللي کتاب و موسيقي
9783642627729
قطعه
عنوان
Springer eBooks
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Nanotechnology.
موضوع مستند نشده
Surfaces (Physics).
نام شخص به منزله سر شناسه - (مسئولیت معنوی درجه اول )