Electron Optics of a Scanning Electron Microscope -- Electron Scattering and Diffusion -- Emission of Backscattered and Secondary Electrons -- Electron Detectors and Spectrometers -- Image Contrast and Signal Processing -- Electron-Beam-Induced Current and Cathodoluminescence -- Special Techniques in SEM -- Crystal Structure Analysis by Diffraction -- Elemental Analysis and Imaging with X-Rays.
بدون عنوان
0
یادداشتهای مربوط به خلاصه یا چکیده
متن يادداشت
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
ویراست دیگر از اثر در قالب دیگر رسانه
شماره استاندارد بين المللي کتاب و موسيقي
9783642083723
قطعه
عنوان
Springer eBooks
موضوع (اسم عام یاعبارت اسمی عام)
موضوع مستند نشده
Physics.
نام شخص به منزله سر شناسه - (مسئولیت معنوی درجه اول )