61. ISTFA 2000 :
Author:
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
62. ISTFA 2011
Author: sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses.,Electronics-- Materials-- Testing, Congresses.
Classification :
TK7871
.
I58
2011eb
63. ISTFA 2012
Author:
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses.,Electronics-- Materials-- Testing, Congresses.
Classification :
TK7801
.
I58
2012eb
64. ISTFA '96
Author:
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses.,Electronics-- Materials-- Testing, Congresses.
65. ISTFA '97
Author: sponsored by ASM International.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses.,Electronics-- Materials-- Testing, Congresses.
66. ISTFA 2001 :
Author:
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
67. ISTFA 2002 :
Author:
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
68. ISTFA 2004
Author:
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
Classification :
TK7871
.
I48
2004
69. ISTFA 2009 :
Author: sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
70. ISTFA 2010
Author: sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses.,Electronics-- Materials-- Testing, Congresses.
Classification :
TK7871
.
I87
2010eb
71. ISTFA 2008 :
Author: sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
72. Introduction to component testing :application electronics
Author: Stevens, Anthony K.
Library: Central Library and Information Center of Birjand University (South Khorasan)
Subject: Testing ، Electronic apparatus and appliances
Classification :
TK
7870
.
S85
1986
73. Know your signal generators
Author: Middleton, Robert Gordon
Library: Central Library and Documentation Center (Kerman)
Subject: Testing ، Electronic apparatus and appliances,، Electronic measurements
Classification :
TK
7870
.
M459
1965
74. Lock-in thermograph
Author: / O. Breitenstein, W. Warta, M. Langenkamp
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography,Electronic books
Classification :
TK7870
.
25
.
B74
2010
75. Lock-in thermography
Author: O. Breitenstein, W. Warta, M. Langenkamp
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography
Classification :
TK
،
7870
.
25
،.
B74
،
2010
76. Lock-in thermography
Author: O. Breitenstein, W. Warta, M. Langenkamp.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing.,Electronic apparatus and appliances-- Thermal properties.,Semiconductors-- Thermal properties.,Thermography.
Classification :
TK7870
.
25
.
B74
2010eb
77. Lock-in thermography
Author: O. Breitenstein, W. Warta, M. Langenkamp.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing.,Electronic apparatus and appliances-- Thermal properties.,Semiconductors-- Thermal properties.,Thermography.
Classification :
TK7870
.
25
.
B74
2010eb
78. Lock-in thermography
Author: / O. Breitenstein, W. Warta, M. Langenkamp
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography
Classification :
E-BOOK
79. Manual of electronic servicing tests and measurements
پدیدآورنده : Robert C. Genn, Jr
موضوع : Electronic apparatus and appliances--Testing,Electronic apparatus and appliances--Maintenance and repair,Electronic measurements
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
80. Manual of electronic servicing tests and measurements
Author: Genn, Robert C.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing ، Electronic apparatus and appliances,Maintenance and repair ، Electronic apparatus and appliances,، Electronic measurements
Classification :
TK
7870
.
G4218
1990
