1. Microelectronics failure analysis
Author: edited by Richard J. Ross ; EDFAS, ASM International.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc.,Electronics-- Materials-- Defects, Handbooks, manuals, etc.,Electronics-- Materials-- Testing, Handbooks, manuals, etc.,Microelectronics-- Defects-- Testing, Handbooks, manuals, etc.,Microelectronics-- Materials-- Testing, Handbooks, manuals, etc.
Classification :
TK7871
.
M52
2011eb
