1. Counterfeit Integrated Circuits

پدیدآورنده :

کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

موضوع : ELECTRONIC|ARCHITECTURE (uncategorised)&ENGINEERING, ELECTRICAL

رده :
E-BOOK

2. Counterfeit integrated circuits : detection and avoidance

پدیدآورنده :

کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)

موضوع : Testing ، Integrated circuits,، Integrated circuits -- Verification,، Product counterfeiting

رده :
TK
7874
.
T43

3. Delay Defects-Test and Diagnosis for Small

پدیدآورنده :

کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

موضوع : ENGINEERING, CIVIL|ENGINEERING, MULTIDISCIPLINARY

رده :
E-BOOK

4. Emerging nanotechnologies

کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)

موضوع : Nanotechnology. ; Microtechnology. ;

5. Emerging nanotechnologies

پدیدآورنده :

کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)

موضوع : Nanotechnology.,Microtechnology.

رده :
T
,
174
.
7
,.
E46
,
2008

6. Emerging topics in hardware security

کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)

موضوع : Computer security. ;

7. Integrated Circuit Authentication

پدیدآورنده :

کتابخانه: Library of Foreign Languages and Islamic Sources (Qom)

موضوع : Integrated circuits -- Verification.,Hardware Trojans (Computers),مدار‌های مجتمع -- راستی‌آزمایی

رده :
E-Book
,

8. Integrated Circuit Authentication

پدیدآورنده :

کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

موضوع : ELECTRONIC|ENGINEERING, MULTIDISCIPLINARY|ARCHITECTURE (uncategorised)&ENGINEERING, CIVIL|ENGINEERING, ELECTRICAL

رده :
E-BOOK

9. Integrated circuit authentication

پدیدآورنده :

کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

موضوع : Integrated circuits, Verification,Hardware Trojans (Computers),Engineering,Circuits and Systems,Processor Architectures,Electronic Circuits and Devices

رده :
E-BOOK

10. Integrated circuit authentication :hardware trojans and counterfeit detection

پدیدآورنده :

کتابخانه: Library and Documentation Center of Kurdistan University (Kurdistan)

موضوع : Verification ، Integrated circuits,، Hardware Trojans )Computers(,، Engineering,، Circuits and Systems,، Processor Architectures,، Electronic Circuits and Devices

رده :
TK7874
.
58

11. Introduction to Hardware Security and Trust

پدیدآورنده :

کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

موضوع : INSTRUMENTATION|ARCHITECTURE (uncategorised)& ELECTRONIC|ENGINEERING, MULTIDISCIPLINARY|INSTRUMENTS &ENGINEERING, CIVIL|ENGINEERING, ELECTRICAL

رده :
E-BOOK

12. Introduction to hardware security and trust

پدیدآورنده :

کتابخانه: Central Library of Hamedan University of Technology (Hamedan)

موضوع : ، Computer security,، Computer input-output equipment,، Data protection,Security measures ، Computer networks,Security measures ، Information technology,، Computer input-output equipment,Security measures ، Computer networks

رده :
QA
76
.
9
.
I58

13. Test and diagnosis for small-delay defects

پدیدآورنده :

کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)

موضوع : Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)

رده :
TK
,
7874
,.
T4323
,
2011

14. Test and diagnosis for small-delay defects

پدیدآورنده :

کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)

موضوع : Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)

رده :
TK7874
.
T4323
2011

15. Test and diagnosis for small-delay defects

پدیدآورنده :

کتابخانه: Library and Documentation Center of Kurdistan University (Kurdistan)

16. delay defects-Test and diagnosis for small

کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)

موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;