141. Frequency Standards and Metrology: Proceedings of the fourth symposium,Ancona,italy,september 5-9,1988
Author: A. De Marchi(ed)
Library: Central Library and Information Center of Shahed University (Tehran)
Subject:
Classification :
QC
،
454
،.
F85
,
F74
،
1989
142. Frequency standards and metrology
Author: Frequency standards and metrology
Library: Vali Asr University Central Library (Kerman)
Subject: Standards,Engineering,Metrology
Classification :
TA
368
.
F7
143. Frequency standards and metrology
Author: Frequency standards and metrology
Library: Vali Asr University Central Library (Kerman)
Subject: Standards,Engineering,Metrology
Classification :
TA
368
.
F7
144. Fringe 2013
Author: Wolfgang Osten, editor.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Imaging systems.,Metrology.,Optical data processing.,Optical measurements.
145. Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author: Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: ، Diffraction patterns--Data processing,، Image processing--Data processing
Classification :
QC
415
.
F88
2014
146. Fringe pattern analysis for optical metrology theory ,algorithms,and applications
Author: Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University.
Library: Vali Asr University Central Library (Kerman)
Subject: Diffraction patterns, Interferometry, Image processing
Classification :
QC
415
.
F88
1989
147. Fringe pattern analysis for optical metrology : theory, algorithms and applications
Author: Servin, Manuel
Library: Library of College of Science University of Tehran (Tehran)
Subject: ، Diffraction patterns,، Optical measurements,، Interferometry
Classification :
QC
39
.
S47
2014
148. Fundamental physics in particle traps
Author: / Wolfgang Quint, Manuel Vogel, editors
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Magnetic traps,Trapped ions,Particles (Nuclear physics),Trapped-particle instabilities,Ionenfalle., (DE-588)4246725-1, gnd
Classification :
E-BOOK
149. Fundamental principles of engineering nanometrology /
Author: Richard Leach
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Metrology.,Microtechnology.,Nanotechnology.
Classification :
T174
.
7
.
L43
2014eb
150. Fundamental principles of engineering nanometrology
Author: Leach, R. K.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Nanotechnology,، Microtechnology,، Metrology
Classification :
T
174
.
7
.
L43
2010
151. Fundamental principles of engineering nanometrology
Author: Leach, R. K.
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Nanotechnology,، Microtechnology,، Metrology
Classification :
T
174
.
7
.
L43
2010
152. Fundamental principles of engineering nanometrology
Author: / Richard Leach
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Metrology,Microtechnology,Nanotechnology
Classification :
T174
.
7
.
L43
2014
153. Fundamental principles of engineering nanometrology /
Author: Richard Leach
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Metrology.,Microtechnology.,Nanotechnology.
Classification :
T174
.
7
.
L43
2014eb
154. Fundamental principles of engineering nanometrology
Author: Leach, R. K.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: ، Nanotechnology,، Microtechnology,، Metrology
Classification :
T
174
.
7
.
L43
2010
155. Fundamentals of dimensional metrology
Author: Dotson, Connie
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: ، Mensuration,، Measuring instruments
Classification :
T
50
.
B8
2003
156. Fundamentals of dimensional metrology /
Author:
Library: Library of Desert International Research Center University of Tehran (Tehran)
Subject: Mensuration.,Measuring instruments.
Classification :
T50
.
B8
1989
157. Fundamentals of dimensional metrology
Author: / Connie Dotson
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Measurement,Measuring instruments
Classification :
T50
F8
2007
158. Fundamentals of dimensional metrology
Author: Ted Busch
Library: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
Subject: Mensuration,Measuring instruments
Classification :
T
,
50
,.
B8
,
1989
159. Fundamentals of dimensional metrology /
Author:
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Mensuration.,Measuring instruments.
Classification :
T
50
.
B8
2006
160. Fundamentals of microfabrication :
Author: Marc J. Madou.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Integrated circuits-- Design and construction.,Lasers-- Industrial applications.,Machining.,Microelectromechanical systems-- Design and construction.,Microelectronic packaging.,Microelectronics.,Circuits intégrés-- Conception et construction,Lasers-- Applications industrielles,Microélectronique,Mise sous boîtier (Microélectronique),Usinage,Circuit intégré,Encapsulamento eletrônico.,Fertigungstechnik,Integrated circuits-- Design and construction.,Laser (aplicações industriais),Lasers-- Industrial applications.,LASERS.,Lithografie,Machining.,MACHINING.,Microelectromechanical systems-- Design and construction.,Microelectronic packaging.,Microelectronics.,MICROELECTRONICS.,Microélectronique.,Microeletrônica.,Microfabrication.,MICROFIBERS.,MICROMODULES.,Mikrofertigung,Mikrosystemtechnik,Mise sous boîtier (Électronique)
Classification :
TK7836
.
M33
2002
