1. Defect-Oriented Testing For Nano-Metric CMOS VLSI Circuits
پدیدآورنده : / by Manoj Sachdev, Jose Pineda de Gyvez
کتابخانه: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
موضوع : CMOS VLSI Circuits
رده :
TK7874
.
D47S2
2010
2. Integrated circuit defect-sensitivity : theory and computational models
پدیدآورنده : by Jose Pineda de Gyvez
کتابخانه: Central Library of Campus 1 Technical University of Tehran (Tehran)
موضوع : Integrated circuits - Very large scale integration - Design and construction - Data processing,Integrated circuits - Very large scale integration - Defects - Mathematical models,Computer-aided design
رده :
TK
7874
.
P53
1993
3. Integrated circuit manufacturability: the art of process and design integration
پدیدآورنده : edited by Jose Pineda de Gyvez, Dhiraj Pradhan
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Design and construction - Data processing ، Integrated circuits,Design and construction - Data processing ، Metal oxide semiconductors, Complimemtary,، Computer-aided design,Testing ، Integrated circuits
رده :
TK
7874
.
I4713
1999
4. Integrated circuit manufacturability: the art of process and design integration
پدیدآورنده : edited by Jose Pineda de Gyvez, Dhiraj Pradhan
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Integrated circuits- Design and construction- Data processing,، Metal oxide semiconductors, Complimentary- Design and construction- Data processing,، Computer-aided design,، Integrated circuits- Testing
رده :
TK
7874
.
I4713
