1. An introduction to the design of pattern recognition devices. Course held at the department for automation and information July 1971
Author: Becker, Peter W
Library: Library of College of Science University of Tehran (Tehran)
Subject: ، Pattern perception
Classification :
Q
237
.
B43
2. Design of Systems and Circuits for Maximum reliability or Masimum Production Jield
Author: / Peter W.Becker,Fimm Jensen
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject:
Classification :
TK7867
.
B36
1977
3. Design of Systems and circuits
Author: Peter W.Becker
Library: Central Library Yasuj University (Kohgiluye va Buyer ahmad)
Subject: Electronic circuit design - data processing,Elctronic apparatus and appliances - design and construction - data processing
Classification :
621
,.
3815
,
B39
,
1977
4. Design of systems and circuits for maximum reliability or maximum production yield
Author: / Peter W. Becker, Finn Jensen
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Electronic circuit design - Data processing,Electronic systems - Design and construction - Data processing,Electronic apparatus and appliances - Reliability - Data processing
Classification :
TK
7867
.
B36
1977
5. Design of systems and circuits for maximum reliability or maximum production yield
پدیدآورنده : Becker, Peter W
موضوع : ، Electronic circuit design-- Data processing,، Electronic systems-- Design and construction-- Data processing,، Electronic apparatus and appliances-- Reliability-- Data processing
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
6. Design of systems and circuits for maximum reliability or maximum production yield
Author: Becker, Peter W.
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Electronic circuit design- Data processing,، Electronic systems- Design and construction- Data processing,، Electronic apparatus and appliances- Reliability- Data processing
Classification :
TK
7867
.
B36
1977
7. Design of systems and circuits for maximum reliability or maximum production yield
Author: Becker, Peter W.
Library: Central Library and Documentation Center (Kerman)
Subject: ، Electronic circuit design - Data processing,Design and construction - Data processing ، Electronic systems,Data processing ، Electronic apparatus and appliances - Reliability
Classification :
TK
7867
.
B36
1977
8. Design of systems & circuits for maximum reliabiblity or maximum production yield
Author: Becker, Peter W.
Library: Central Library and Information Center of Birjand University (South Khorasan)
Subject: ، Electronics circuit design - data processing,، Electronics apparatus & appliances- design & construction- data processing
Classification :
TK
7867
.
B36
1977
9. Design of systmes and circuits for maximum reliability or maximum production yield
Author: Becker, Peter W.
Library: Library and Documentation Center of Iranian Research Organization for Science and Technology (Tehran)
Subject: $AElectronic circuit design - Data processing,$AElectronic apparatus and appliances - Design and construction - Data processing,$AElectronic apparatus and appliances - Reliability - Data processing
Classification :
TK
7867
.
B36
1977
10. Recognition of Patterns :
Author: by Peter W. Becker.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Computer science.,Optical pattern recognition.,Perception de structure.
Classification :
Q327
.
B974
1974
11. Recognition of patterns using the frequencies of binary words
Author: / Peter W. Becker
Library: Central Library and Archive Center of shahid Beheshti University (Tehran)
Subject: Pattern perception
Classification :
001
.
534
Be-R
1974
12. Recognition of patterns using the frequencies of occurrence of binary words
Author: Becker, Peter W.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Pattern perception
Classification :
Q
327
.
B4
1978
13. Recognition of patterns : using the frequencies of occurrence of binary words
Author: / Peter W. Becker
Library: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
Subject: Pattern perception
Classification :
Q327
.
B4
1978
14. The world of the cell
Author: Wayne M. Becker, David W. Deamer; contributors, Peter B. Armstrong ... [et al.]
Library: Library of Institute of Biochemistry and Biophysics of University of Tehran (Tehran)
Subject: Cytology,Molecular biology
Classification :
QH
581
.
2
.
B43
1991
