1. Digital systems testing and testable design
Author: Abramovici, Miron.
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Digital integrated circuits - Testing , Digital integrated circuits - Design and construction
Classification :
TK
7874
.
A23
2. Digital systems testing and testable design
Author: Abramovici, Miron
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Digital integrated circuits- Testing,، Digital integrated circuits- Design and construction
Classification :
TK
7874
.
A23
1990
3. Digital systems testing and testable design
پدیدآورنده : Abramovici, Miron.
موضوع : ، Digital integrated circuits-- Testing,، Digital integrated circuits-- Design and construction
۳ نسخه از این کتاب در ۳ کتابخانه موجود است.
4. Digital systems testing and testable design /
Author: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Digital integrated circuits-- Design and construction.,Digital integrated circuits-- Testing.,Digital integrated circuits-- Design and construction.,Digital integrated circuits-- Testing.
Classification :
TK7874
.
A23
1990b
5. Digital systems testing and testable design
Author: / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Digital integrated circuits - Testing,Digital integrated circuits - Design and construction
Classification :
TK
7874
.
A23
1990
