1. X-ray metrology in semiconductor manufacturing
Author: Bowen, D. Keith )David Keith(
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Semiconductors-- Design and construction Quality control,، Integrated circuits-- Measurement,، Semiconductor wafers-- Inspection,، X-rays-- Diffraction,، Fluroscopy
Classification :
TK
7874
.
58
.
B69
2006
2. X-ray metrology in semiconductor manufacturing
Author: Bowen, D. Keith)David Keith(
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: ، Semiconductors- Design and construction- Quality control,، Integrated circuits- Measurement,، Semiconductor wafers- Inspection,، X-rays- Diffraction,، Fluroscopy
Classification :
TK
7874
.
58
.
B69
2006
