1. Digital systems testing and testable design
Author: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Digital integrated circuits-- Testing,Digital integrated circuits-- Design and construction
Classification :
TK
،
7874
،.
A23
،
1990
2. Digital systems testing and testable design
Author: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Library: Central Library and Document Center of Shahid Madani University of Azarbayjan (East Azarbaijan)
Subject: Digital integrated circuits -- Testing,Digital integrated circuits -- Design and construction
Classification :
TK
,
7874
,.
A23
,
1990
