1. LSI/VLSI testability design
Author: Frank F. Tsui
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Integrated circuits-- Large scale integration-- Testing,Integrated circuits-- Very large scale integration-- Testing
Classification :
TK
،
7874
،.
T78
،
1987
2. LSI/VLSI testability design
Author: Tsui, Frank F
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Integrated circuits- Large scale integration- Testing,، Integrated circuits- Very large scale integration- Testing
3. LSI/VLSI testability design
Author: Tsui, Frank F.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Large scale integration-- Testing,، Integrated circuits-- Very large scale integration-- Testing
Classification :
TK
7874
.
T78
1987
