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ورود / ثبت نام
عنوان
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuit
پدید آورنده
/ [electronic resource
موضوع
رده
کتابخانه
Central Library and Document Center of Shahid Chamran University
محل استقرار
استان:
Khuzestan
ـ شهر:
Ahvaz
تماس با کتابخانه :
33360244
-
061
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9780387465463
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
ebook34347
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuit
General Material Designation
[Electronic Resource]
First Statement of Responsibility
/ [electronic resource
EDITION STATEMENT
Edition Statement
2nd ed.,Revised
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
: Springer
Date of Publication, Distribution, etc.
, June 2007.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource
SERIES
Series Title
(Frontiers in Electronic Testing Ser.)
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
e
SERIES
Title
Frontiers in Electronic Testing Ser
DEWEY DECIMAL CLASSIFICATION
Number
621
.
395
PERSONAL NAME - PRIMARY RESPONSIBILITY
Sachdev, Manoj
PERSONAL NAME - SECONDARY RESPONSIBILITY
Pineda De Gyvez, Jos
SpringerLink ebooks - Engineering (2007
ORIGINATING SOURCE
Country
ایران
LOCATION AND CALL NUMBER
Call Number
621.395
ELECTRONIC LOCATION AND ACCESS
Date and Hour of Consultation and Access
9780387465463.pdf
Electronic Format Type
0
old catalog
e
BL
1
a
Y
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