عنوان
پدید آورنده
موضوع
رده
TK 7874.75 .L35 1997
TK
7874
.
75
.
L35
1997
کتابخانه
محل استقرار
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
English
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Digital circuit testing and testability
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
San Diego
Name of Publisher, Distributor, etc.
Academic Press
Date of Publication, Distribution, etc.
c1997
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xii, 199 p. : ill. ; 24 cm
GENERAL NOTES
Text of Note
Includes bibliographical references and index
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
Parag K. Lala
ORIGINAL VERSION NOTE
Text of Note
1
Text of Note
2
TOPICAL NAME USED AS SUBJECT
Entry Element
Testing ، Integrated circuits - Very large scale integration
Entry Element
Testing ، Digital integrated circuits
Entry Element
، Integrated circuits - Fault tolerance
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
75
.
L35
1997
OTHER CLASS NUMBERS
Class number
CA
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Lala, Parag K.
Relator Code
AU
TI
