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عنوان
Power- constrained testing of VLSI circuits

پدید آورنده
Nicolici, Nicola

موضوع
Testing ، Integrated circuits, Very large scale integration,Protection ، Integrated circuits, Very large scale integration,Thermal properties ، Semiconductors

رده
TK
7874
.
75
.
N5P6

کتابخانه

محل استقرار
استان: Semnan ـ شهر: Shahrud



تماس با کتابخانه : 32300335-023

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
Power- constrained testing of VLSI circuits

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer academic
Date of Publication, Distribution, etc.
2003

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
xi,178 p. : illus, tables

SERIES

Other Title Information
Frontiers in electronic testing ; 22

GENERAL NOTES

Text of Note
Bibliography: p. 163-173 and index

NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY

Text of Note
by Nicola Nicolici and Bashir M. Al-Hashimi

ORIGINAL VERSION NOTE

Text of Note
1

TOPICAL NAME USED AS SUBJECT

Entry Element
Testing ، Integrated circuits, Very large scale integration
Entry Element
Protection ، Integrated circuits, Very large scale integration
Entry Element
Thermal properties ، Semiconductors

LIBRARY OF CONGRESS CLASSIFICATION

Class number
TK
7874
.
75
.
N5P6

PERSONAL NAME - PRIMARY RESPONSIBILITY

Entry Element
Nicolici, Nicola
Relator Code
AU

AU Al- Hashimi, Bashir
TI
SE

Proposal/Bug Report

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