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عنوان
Power- constrained testing of VLSI circuits
پدید آورنده
Nicolici, Nicola
موضوع
Testing ، Integrated circuits, Very large scale integration,Protection ، Integrated circuits, Very large scale integration,Thermal properties ، Semiconductors
رده
TK
7874
.
75
.
N5P6
کتابخانه
محل استقرار
استان:
Semnan
ـ شهر:
Shahrud
تماس با کتابخانه :
32300335
-
023
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Power- constrained testing of VLSI circuits
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer academic
Date of Publication, Distribution, etc.
2003
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xi,178 p. : illus, tables
SERIES
Other Title Information
Frontiers in electronic testing ; 22
GENERAL NOTES
Text of Note
Bibliography: p. 163-173 and index
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
by Nicola Nicolici and Bashir M. Al-Hashimi
ORIGINAL VERSION NOTE
Text of Note
1
TOPICAL NAME USED AS SUBJECT
Entry Element
Testing ، Integrated circuits, Very large scale integration
Entry Element
Protection ، Integrated circuits, Very large scale integration
Entry Element
Thermal properties ، Semiconductors
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
75
.
N5P6
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Nicolici, Nicola
Relator Code
AU
AU Al- Hashimi, Bashir
TI
SE
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