Proceedings: International Workshop on Memory Technology, Design, and Testing
General Material Designation
[book]
First Statement of Responsibility
/ edited by F. Lombardi, R. Rajsuman, and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Council
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Los Alamitos, Calif.
Name of Publisher, Distributor, etc.
: IEEE Computer Society Press
Date of Publication, Distribution, etc.
، 1997
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
ix, 103 p.
Other Physical Details
:ill.
GENERAL NOTES
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
Semiconductor storage devices
Entry Element
Random access memory
Topical Subdivision
-- Testing Congresses
Topical Subdivision
-- Congresses
DEWEY DECIMAL CLASSIFICATION
Number
621
.
39732
I11P
1997
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7895
.
M4I334
1997
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Entry Element
Lombardi, Fabrizio
Entry Element
1955-
Entry Element
Rajsuman, Rochit
Entry Element
Wik, Thomas
Dates
، 1955-
Relator Code
creator
Relator Code
creator
Relator Code
creator
CORPORATE BODY NAME - SECONDARY RESPONSIBILITY
Entry Element
IEEE International Workshop on Memory Technology, Design, and Testing (1997: San Jose, Calif.)
Entry Element
IEEE Computer Society. Test Technology Technical Committee
Entry Element
IEEE Computer Society. Technical Committee on VLSI