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عنوان
Advanced test methods for SRAMs: <effective solutions for dynamic fault detection in nanoscaled technologies>
پدید آورنده
/ by Alberto Bosio ... [et al.]
موضوع
Random access memory,-- Testing
رده
621
.
3973
A244
2010
کتابخانه
Central Library and Archive Center of shahid Beheshti University
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
22431916
-
021
NATIONAL BIBLIOGRAPHY NUMBER
Number
275908
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Advanced test methods for SRAMs: <effective solutions for dynamic fault detection in nanoscaled technologies>
General Material Designation
[book]
First Statement of Responsibility
/ by Alberto Bosio ... [et al.]
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
: Springer
Date of Publication, Distribution, etc.
، 2010
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xv, 171 p.
Other Physical Details
: ill.
GENERAL NOTES
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
Random access memory
Topical Subdivision
-- Testing
DEWEY DECIMAL CLASSIFICATION
Number
621
.
3973
A244
2010
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Entry Element
Bosio, Alberto
Relator Code
creator
ORIGINATING SOURCE
Country
ایران
LOCATION AND CALL NUMBER
Call Number
621 .3973 A244 2010
Previous cataloging
BL
1
Y
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