NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
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Includes bibliographical references and index..
CONTENTS NOTE
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Summary: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
SERIES
Title
Springer series in surface sciences
Volume Number
v.52
TOPICAL NAME USED AS SUBJECT
Ellipsometry
Physics
Surface and Interface Science, Thin Films
Surfaces and Interfaces, Thin Films
Physical Chemistry
Optics, Optoelectronics, Plasmonics and Optical Devices