Semiconductor material and device characterization
General Material Designation
[Book]
First Statement of Responsibility
/ Dieter K. Schroder
EDITION STATEMENT
Edition Statement
3rd ed.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
[Piscataway, NJ]
Name of Publisher, Distributor, etc.
: IEEE Press ; Hoboken, N.J. : Wiley,
Date of Publication, Distribution, etc.
, c2006.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xv, 779 p. , ill. , 25 cm.
GENERAL NOTES
Text of Note
"Wiley-Interscience."
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
CONTENTS NOTE
Text of Note
Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.