INTERNATIONAL STANDARD BOOK NUMBER
Erroneous ISBN
140204366X (PB : acid-free paper)
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
EN-50843
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Defects in high-k gate dielectric stacks :
General Material Designation
[Book]
Other Title Information
:nano-electronic semiconductor devices
First Statement of Responsibility
/ edited by Evgeni Gusev
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Dordrecht, Netherlands
Name of Publisher, Distributor, etc.
: Springer,
Date of Publication, Distribution, etc.
, c2006.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 492 p. , ill. , 25 cm.
SERIES
Series Title
(NATO science series. Series II, Mathematics, physics and chemistry
Series Title
(NATO science series. Series II, Mathematics, physics and chemistry
Volume Designation
; v. 220)
Volume Designation
; v. 220)
GENERAL NOTES
Text of Note
"Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia"--T.p. verso.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Electronic
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and indexes.
CONTENTS NOTE
Text of Note
High-k technology -- Defects in high-k dielectrics : characterization -- High-k processing and defects -- High-k theory -- Electrically active defects -- Interfaces -- Processing, characterization and devices.
SERIES
Title
NATO science series. Series II, Mathematics, physics, and chemistry
Volume Number
v. 220
OTHER VARIANT TITLES
Variant Title
Nano-electronic semiconductor devices
TOPICAL NAME USED AS SUBJECT
Gate array circuits , Congresses
Dielectrics , Congresses
Semiconductors , Defects , Congresses
LIBRARY OF CONGRESS CLASSIFICATION
Class number
E-BOOK
PERSONAL NAME - PRIMARY RESPONSIBILITY
NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia)
PERSONAL NAME - SECONDARY RESPONSIBILITY
Gusev, Evgeni
ORIGINATING SOURCE
Country
ایران
ELECTRONIC LOCATION AND ACCESS
Host name
9781402043666.pdf
Access number
عادی
Compression information
عادی
Date and Hour of Consultation and Access
9781402043666.pdf
Electronic Format Type
متن
old catalog
e
BL
1
a
Y
