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عنوان
wafer Monitoring System-Feature Profile Evolution in Plasma Processing Using On

پدید آورنده
/ Seiji Samukawa

موضوع
ENGINEERING, CIVIL|ENGINEERING, MULTIDISCIPLINARY

رده
E-BOOK

کتابخانه
Central Library, Center of Documentation and Supply of Scientific Resources

محل استقرار
استان: East Azarbaijan ـ شهر:

Central Library, Center of Documentation and Supply of Scientific Resources

تماس با کتابخانه : 04133443834

INTERNATIONAL STANDARD BOOK NUMBER

(Number (ISBN
9784431547952

NATIONAL BIBLIOGRAPHY NUMBER

Country Code
IR
Number
EN-7978

LANGUAGE OF THE ITEM

.Language of Text, Soundtrack etc
انگلیسی

COUNTRY OF PUBLICATION OR PRODUCTlON

Country of publication
IR

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
wafer Monitoring System-Feature Profile Evolution in Plasma Processing Using On
General Material Designation
[Book]
First Statement of Responsibility
/ Seiji Samukawa

.PUBLICATION, DISTRIBUTION, ETC

Name of Publisher, Distributor, etc.
Springer
Date of Publication, Distribution, etc.
, 2014.

NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.

Text of Note
Electronic

TOPICAL NAME USED AS SUBJECT

ENGINEERING, CIVIL|ENGINEERING, MULTIDISCIPLINARY

LIBRARY OF CONGRESS CLASSIFICATION

Class number
E-BOOK

PERSONAL NAME - PRIMARY RESPONSIBILITY

Seiji Samukawa

ORIGINATING SOURCE

Country
ایران

ELECTRONIC LOCATION AND ACCESS

Host name
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Access number
عادی
Compression information
محرمانه
Date and Hour of Consultation and Access
461128.pdf
Electronic Format Type
متن

old catalog

e

BL
1

a
Y

Proposal/Bug Report

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