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ورود / ثبت نام
عنوان
Semiconductor device and failure analysis using photon microscopy
پدید آورنده
/ by Wai Kin Chim
موضوع
Semiconductors- Failures,Semiconductors- Testing,Semiconductors- Microscopy,Photon emission
رده
TK7871
.
85
.
C47
2000
کتابخانه
Central Library, Center of Documentation and Supply of Scientific Resources
محل استقرار
استان:
East Azarbaijan
ـ شهر:
تماس با کتابخانه :
04133443834
INTERNATIONAL STANDARD BOOK NUMBER
Qualification
(V.1)
(Number (ISBN
047149240
NATIONAL BIBLIOGRAPHY NUMBER
Country Code
IR
Number
4816
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
COUNTRY OF PUBLICATION OR PRODUCTlON
Country of publication
IR
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Semiconductor device and failure analysis using photon microscopy
General Material Designation
[Book]
First Statement of Responsibility
/ by Wai Kin Chim
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Chichester
Name of Publisher, Distributor, etc.
: John Wiley and Sons
Date of Publication, Distribution, etc.
, 2000.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
XV, 269P
Other Physical Details
: Illus, Diag, Table
GENERAL NOTES
Text of Note
Language: انگلیسی
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Print
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Semiconductors- Failures
Semiconductors- Testing
Semiconductors- Microscopy
Photon emission
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7871
.
85
Book number
.
C47
2000
PERSONAL NAME - PRIMARY RESPONSIBILITY
Chim, Wai Kin
ORIGINATING SOURCE
Country
ایران
old catalog
p
BL
1
a
Y
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