NATIONAL BIBLIOGRAPHY NUMBER
Number
oldebook14655
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
eng
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
metric CMOS VLSI circuits-oriented testing for nano-Defect
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Dordrecht :
Name of Publisher, Distributor, etc.
: Springer,
Date of Publication, Distribution, etc.
, 2007.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Print
TOPICAL NAME USED AS SUBJECT
Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Metal oxide semiconductors, Complementary ; Defects. ; Metal oxide semiconductors, Complementary ; Testing. ;
PERSONAL NAME - PRIMARY RESPONSIBILITY
Sachdev, Manoj. ; Pineda de Gyvez, Jos?. ; Sachdev, Manoj. ; Defect oriented testing for CMOS analog and digital circuits. ;
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