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ورود / ثبت نام
عنوان
delay defects-Test and diagnosis for small
پدید آورنده
موضوع
Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;
رده
کتابخانه
Central Library and Documents Center of Mazandaran University
محل استقرار
استان:
Mazandaran
ـ شهر:
Babolsar
تماس با کتابخانه :
62
-
35302861
-
011
NATIONAL BIBLIOGRAPHY NUMBER
Number
oldebook1967
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
eng
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
delay defects-Test and diagnosis for small
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York ;London :
Name of Publisher, Distributor, etc.
: Springer,
Date of Publication, Distribution, etc.
, 2011.
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Print
TOPICAL NAME USED AS SUBJECT
Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;
PERSONAL NAME - PRIMARY RESPONSIBILITY
; Peng, Ke. ; Chakrabarty, Krishnendu. ; -Tehranipoor, Mohammad H., ; 1974
old catalog
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