Menu
Home
Advanced Search
Directory of Libraries
عنوان
High resolution X-ray diffractometry and topography
پدید آورنده
/ D. Keith Bowen, Brian K. Tanner
موضوع
X-ray crystallography.,X-rays- Diffraction.,Crystals
رده
QD945
.
B683
1998
کتابخانه
Central Library and Documents Center of Mazandaran University
محل استقرار
استان:
Mazandaran
ـ شهر:
Babolsar
تماس با کتابخانه :
62
-
35302861
-
011
INTERNATIONAL STANDARD BOOK NUMBER
Qualification
(V.1)
(Number (ISBN
0850667585
NATIONAL BIBLIOGRAPHY NUMBER
Number
22801
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
eng
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
High resolution X-ray diffractometry and topography
First Statement of Responsibility
/ D. Keith Bowen, Brian K. Tanner
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
London
Name of Publisher, Distributor, etc.
: Taylor.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 252 p.
Other Physical Details
: ill
GENERAL NOTES
Text of Note
Language: انگلیسی
NOTES PERTAINING TO PUBLICATION, DISTRIBUTION, ETC.
Text of Note
Print
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
X-ray crystallography.
Entry Element
X-rays- Diffraction.
Entry Element
Crystals
PERSONAL NAME - PRIMARY RESPONSIBILITY
Bowen, D. Keith (David Keith), 1940-
PERSONAL NAME - SECONDARY RESPONSIBILITY
Tanner, B. K.(Brian Keith)
old catalog
Proposal/Bug Report
×
Proposal/Bug Report
×
Warning!
Enter The Information Carefully
Error Report
Proposal