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ورود / ثبت نام
عنوان
An artificial intelligence approach to test generation
پدید آورنده
Singh, Narinder, 6591-
موضوع
، Integrated circuits -- Very large scale integration -- Testing -- Data processing,، Expert systems )Computer science(,، Artificial intelligence
رده
TK
7874
.
S533
کتابخانه
Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
88881052
-
88881042
-
021
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
An artificial intelligence approach to test generation
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
c1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 193 p. : ill. ; 25 cm
SERIES
Other Title Information
The Kluwer international series in engineering and computer science ; SECS 91
GENERAL NOTES
Text of Note
Bibliography: p. ]189[-193.
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
by Narinder Singh
ORIGINAL VERSION NOTE
Text of Note
1
Text of Note
2
TOPICAL NAME USED AS SUBJECT
Entry Element
، Integrated circuits -- Very large scale integration -- Testing -- Data processing
Entry Element
، Expert systems )Computer science(
Entry Element
، Artificial intelligence
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
S533
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Singh, Narinder, 6591-
Relator Code
AU
TI
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