عنوان
پدید آورنده
موضوع
رده
TK 7874 .I3233 1993
TK
7874
.
I3233
1993
کتابخانه
محل استقرار
E1
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures: March 22-25, 1993, Sitges, Barcelona, Spain
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
Institute of Electrical and Electronics Engineers
Date of Publication, Distribution, etc.
]199?[
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xv, 297 p. : ill
GENERAL NOTES
Text of Note
94CH3220-1
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
Integrated circuits - Testing - Congresses
Entry Element
Semiconductors - Testing - Congresses
Entry Element
Transistors - Testing - Congresses
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
Book number
7874
Classification Record Number
.
I3233
1993
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
sponsored by the IEEE Electron Devices Society
CORPORATE BODY NAME - SECONDARY RESPONSIBILITY
Entry Element
IEEE International Conference on Microelectronic Test Structures )1993 : Barcelona, Spain(
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
English
