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عنوان
An artificial intelligence approach to test generation
پدید آورنده
Singh, Narinder
موضوع
Integrated circuits - Very large scale integration - Testing - Data processing , Expert systems )Computer science( , Artificial intelligence
رده
TK
7874
.
S533
کتابخانه
Central Library of Amirkabir University of Technology
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
۶۶۴۰۷۴۱۸(۰۲۱) – ۶۴۵۴۲۳۴۹(۰۲۱)
CE
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Singh, Narinder
Title Proper
An artificial intelligence approach to test generation
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 193 p. : ill
SERIES
Series Title
The Kluwer international series in engineering and computer science, SECS 19
GENERAL NOTES
Text of Note
Includes bibliographical references )p. ]189[-193(
TOPICAL NAME USED AS SUBJECT
Entry Element
Integrated circuits - Very large scale integration - Testing - Data processing
Entry Element
Expert systems )Computer science(
Entry Element
Artificial intelligence
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
Book number
7874
Classification Record Number
.
S533
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Dates
1956-
Entry Element
by Narinder Singh
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
English
Proposal/Bug Report
×
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