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عنوان
The role of microscopy in semiconductor failure analysis
پدید آورنده
Richards, B. P.
موضوع
Semiconductors - Testing , Semiconductors - Failures , Microscopes
رده
TK
7871
.
85
.
R464
کتابخانه
Central Library of Amirkabir University of Technology
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
۶۶۴۰۷۴۱۸(۰۲۱) – ۶۴۵۴۲۳۴۹(۰۲۱)
CE
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Richards, B. P.
Title Proper
The role of microscopy in semiconductor failure analysis
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Oxford
Name of Publisher, Distributor, etc.
Oxford University Press
Date of Publication, Distribution, etc.
1992
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
vi, 108 p. : ill
SERIES
Series Title
Oxford science publication
GENERAL NOTES
Text of Note
Includes bibliographical references )p. ]98[-101( and index
TOPICAL NAME USED AS SUBJECT
Entry Element
Semiconductors - Testing
Entry Element
Semiconductors - Failures
Entry Element
Microscopes
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
Book number
7871
.
85
Classification Record Number
.
R464
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
B.P. Richards and P.K. Footner
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
English
Proposal/Bug Report
×
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