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عنوان
Statistical performance modeling and optimization /

پدید آورنده
Xin Li, Jiayong Le, Lawrence T. Pileggi.

موضوع
Integrated circuits-- Design and construction.,Integrated circuits-- Design and construction.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- General.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Integrated.

رده
TK7874
.
L59
2007eb

کتابخانه
Center and Library of Islamic Studies in European Languages

محل استقرار
استان: Qom ـ شهر: Qom

Center and Library of Islamic Studies in European Languages

تماس با کتابخانه : 32910706-025

INTERNATIONAL STANDARD BOOK NUMBER

(Number (ISBN
1601980574
(Number (ISBN
9781601980571
Erroneous ISBN
9781601980564

NATIONAL BIBLIOGRAPHY NUMBER

Number
b740016

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
Statistical performance modeling and optimization /
General Material Designation
[Book]
First Statement of Responsibility
Xin Li, Jiayong Le, Lawrence T. Pileggi.

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Boston :
Name of Publisher, Distributor, etc.
Now,
Date of Publication, Distribution, etc.
©2007.

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
1 online resource (1 volume) :
Other Physical Details
illustrations (some color)

SERIES

Series Title
Foundations and trends in electronic design automation ;
Volume Designation
v. 1, issue 4

GENERAL NOTES

Text of Note
Offprint. Foundations and trends in electronic design automation. Vol. 1, no. 4 (2006).

INTERNAL BIBLIOGRAPHIES/INDEXES NOTE

Text of Note
Includes bibliographical references.

CONTENTS NOTE

Text of Note
Abstract -- 1. Introduction -- 2. Process variations -- 3. Transistor-level statistical methodologies -- 4. System-level statistical methodologies -- 5. Robust design of future ICs -- Acknowledgments -- References.
0

SUMMARY OR ABSTRACT

Text of Note
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing processes have introduced unavoidable and significant uncertainty in circuit performance; hence ensuring manufacturability has been identified as one of the top priorities of today's IC design problems. In this paper, we review various statistical methodologies that have been recently developed to model, analyze, and optimize performance variations at both transistor level and system level. The following topics will be discussed in detail: sources of process variations, variation characterization and modeling, Monte Carlo analysis, response surface modeling, statistical timing and leakage analysis, probability distribution extraction, parametric yield estimation and robust IC optimization. These techniques provide the necessary CAD infrastructure that facilitates the bold move from deterministic, corner-based IC design toward statistical and probabilistic design.

ACQUISITION INFORMATION NOTE

Source for Acquisition/Subscription Address
01251032

OTHER EDITION IN ANOTHER MEDIUM

Title
Statistical performance modeling and optimization.
International Standard Book Number
9781601980564

TOPICAL NAME USED AS SUBJECT

Integrated circuits-- Design and construction.
Integrated circuits-- Design and construction.
TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- General.
TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Integrated.

(SUBJECT CATEGORY (Provisional

TEC-- 008010
TEC-- 008020

DEWEY DECIMAL CLASSIFICATION

Number
621
.
3815
Edition
22

LIBRARY OF CONGRESS CLASSIFICATION

Class number
TK7874
Book number
.
L59
2007eb

PERSONAL NAME - PRIMARY RESPONSIBILITY

Li, Xin,1977-

PERSONAL NAME - ALTERNATIVE RESPONSIBILITY

Le, Jiayong.
Pileggi, Lawrence,1962-

ORIGINATING SOURCE

Date of Transaction
20201204005850.0
Cataloguing Rules (Descriptive Conventions))
pn

ELECTRONIC LOCATION AND ACCESS

Electronic name
 مطالعه متن کتاب 

[Book]

Y

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