عنوان
پدید آورنده
موضوع
رده
TA417.23 .W36 1996
TA417
.
23
.
W36
1996
کتابخانه
محل استقرار
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
0511525257
(Number (ISBN
9780511525254
Erroneous ISBN
9780521017954 (paperback)
Erroneous ISBN
9780521482660 (hardback)
NATIONAL BIBLIOGRAPHY NUMBER
Number
b706195
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Reflection electron microscopy and spectroscopy for surface analysis /
General Material Designation
[Book]
First Statement of Responsibility
Zhong Lin Wang.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Cambridge :
Name of Publisher, Distributor, etc.
Cambridge University Press,
Date of Publication, Distribution, etc.
1996.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource (xix, 436 pages) :
Other Physical Details
PDF file(s).
GENERAL NOTES
Text of Note
Title from publisher's bibliographic system (viewed on 05 Oct 2015).
SUMMARY OR ABSTRACT
Text of Note
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
OTHER EDITION IN ANOTHER MEDIUM
International Standard Book Number
9780521482660
PARALLEL TITLE PROPER
Parallel Title
Reflection Electron Microscopy & Spectroscopy for Surface Analysis
TOPICAL NAME USED AS SUBJECT
Materials-- Microscopy.
Reflection electron microscopy.
Surfaces (Technology)-- Analysis.
Materials-- Microscopy.
Reflection electron microscopy.
Surfaces (Technology)-- Analysis.
DEWEY DECIMAL CLASSIFICATION
Number
620/
.
44
Edition
20
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TA417
.
23
Book number
.
W36
1996
PERSONAL NAME - PRIMARY RESPONSIBILITY
Wang, Zhong Lin
ORIGINATING SOURCE
Date of Transaction
20201207212843.0
ELECTRONIC LOCATION AND ACCESS
Electronic name
مطالعه متن کتاب [Book]
Y
