22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers /
First Statement of Responsibility
S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Singapore :
Name of Publisher, Distributor, etc.
Springer,
Date of Publication, Distribution, etc.
2019.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource (xviii, 722 pages) :
Other Physical Details
illustrations (some color)
SERIES
Series Title
Communications in computer and information science,
Volume Designation
892
ISSN of Series
1865-0929 ;
GENERAL NOTES
Text of Note
Includes author index.
CONTENTS NOTE
Text of Note
Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
0
SUMMARY OR ABSTRACT
Text of Note
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
ACQUISITION INFORMATION NOTE
Source for Acquisition/Subscription Address
Springer Nature
Stock Number
com.springer.onix.9789811359507
OTHER EDITION IN ANOTHER MEDIUM
International Standard Book Number
9789811359491
International Standard Book Number
9789811359514
PARALLEL TITLE PROPER
Parallel Title
VDAT 2018
TOPICAL NAME USED AS SUBJECT
Integrated circuits-- Very large scale integration-- Design and construction, Congresses.
Integrated circuits-- Very large scale integration-- Testing, Congresses.
Integrated circuits-- Very large scale integration-- Design and construction.
Integrated circuits-- Very large scale integration-- Testing.
(SUBJECT CATEGORY (Provisional
COM067000
UK
UK
DEWEY DECIMAL CLASSIFICATION
Number
621
.
39/5
Edition
23
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7874
.
75
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Balamurugan, N. B.
Gracia Nirmala Rani, D.
Rajaram, S.,1973-
Singh, Virendra, (Associate professor of electrical engineering)