Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy.
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SUMMARY OR ABSTRACT
Text of Note
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
ACQUISITION INFORMATION NOTE
Source for Acquisition/Subscription Address
Springer Nature
Stock Number
com.springer.onix.9789811304545
OTHER EDITION IN ANOTHER MEDIUM
Title
Progress in nanoscale characterization and manipulation.
International Standard Book Number
9789811304538
TOPICAL NAME USED AS SUBJECT
Electron microscopy.
Nanostructured materials-- Optical properties.
Characterization and Evaluation of Materials.
Nanoscale Science and Technology.
Physics.
Spectroscopy and Microscopy.
Electron microscopy.
Nanostructured materials-- Optical properties.
Nanotechnology.
Science-- Nanostructures.
Science-- Spectroscopy & Spectrum Analysis.
Spectrum analysis, spectrochemistry, mass spectrometry.