عنوان

Spectroscopic ellipsometry for photovoltaics.

(Number (ISBN

3319753754

(Number (ISBN

3319753762

(Number (ISBN

3319753770

(Number (ISBN

9783319753751

(Number (ISBN

9783319753768

(Number (ISBN

9783319753775

Erroneous ISBN

9783319753751

Title Proper

Spectroscopic ellipsometry for photovoltaics.

General Material Designation

[Book]

First Statement of Responsibility

Hiroyuki Fujiwara, Robert W. Collins, editors.

Volume Designation

Volume 1,dollar5Fundamental principles and solar cell characterization /

Place of Publication, Distribution, etc.

Cham, Switzerland :

Name of Publisher, Distributor, etc.

Springer,

Date of Publication, Distribution, etc.

2018.

Specific Material Designation and Extent of Item

1 online resource (xx, 594 pages) :

Other Physical Details

illustrations (some color)

Series Title

Springer series in optical sciences,

Volume Designation

volume 212

ISSN of Series

0342-4111 ;

Text of Note

Includes bibliographical references and index.

Text of Note

Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In, Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S, Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.

0

Text of Note

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Source for Acquisition/Subscription Address

Springer Nature

Stock Number

com.springer.onix.9783319753775

International Standard Book Number

9783319753751

International Standard Book Number

9783319753768

Parallel Title

Fundamental principles and solar cell characterization

Ellipsometry.

Photovoltaic power generation.

Ellipsometry.

Photovoltaic power generation.

PHJ

TEC019000

TTB

TTBL

Number

Edition

Class number

Collins, Robert W.

Fujiwara, Hiroyuki

Date of Transaction

20200823105851.0

Cataloguing Rules (Descriptive Conventions))

pn

Electronic name

[Book]

Y