عنوان

Scanning Tunneling Microscopy II :

(Number (ISBN

3642973639

(Number (ISBN

9783642973635

Number

b576692

Title Proper

Scanning Tunneling Microscopy II :

General Material Designation

[Book]

Other Title Information

Further Applications and Related Scanning Techniques

First Statement of Responsibility

edited by Roland Wiesendanger, Hans-Joachim Güntherodt.

Place of Publication, Distribution, etc.

Berlin, Heidelberg

Name of Publisher, Distributor, etc.

Springer Berlin Heidelberg

Date of Publication, Distribution, etc.

1992

Specific Material Designation and Extent of Item

(xiv, 308 pages 159 illustrations)

Series Title

Springer series in surface sciences, 28.

Text of Note

1. Introduction --; 1.1 STM in Electrochemistry and Biology --; 1.2 Probing Small Forces on a Small Scale --; 1.3 Related Scanning Probe Microscopies --; 1.4 Nanotechnology --; References --; 2. STM in Electrochemistry --; 2.1 Principal Aspects --; 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes --; 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes --; 2.4 Outlook --; References --; 3. The Scanning Tunneling Microscope in Biology --; 3.1 Instrumentation --; 3.2 Processing of STM Images --; 3.3 Preparation --; 3.4 Applications --; 3.5 Imaging and Conduction Mechanisms --; 3.6 Conclusions --; References --; 4. Scanning Force Microscopy (SFM) --; 4.1 Experimental Aspects of Force Microscopy --; 4.2 Forces and Their Relevance to Force Microscopy --; 4.3 Microscopic Description of the Tip--Sample Contact --; 4.4 Imaging with the Force Microscope --; 4.5 Conclusions and Outlook --; References --; 5. Magnetic Force Microscopy (MFM) --; 5.1 Basic Principles of MFM --; 5.2 Measurement Techniques --; 5.3 Force Sensors --; 5.4 Theory of MFM Response --; 5.5 Imaging Data Storage Media --; 5.6 Imaging Soft Magnetic Materials --; 5.7 Resolution --; 5.8 Separation of Magnetic and Topographic Signals --; 5.9 Comparison with Other Magnetic Imaging Techniques --; 5.10 Conclusions and Outlook --; References --; 6. Related Scanning Techniques --; 6.1 Historical Background --; 6.2 STM and Electrical Measurements --; 6.3 STM and Optical Effects --; 6.4 Near-Field Thermal Microscopy --; 6.5 Scanning Force Microscopy and Extensions --; 6.6 Conclusion --; References --; 7. Nano-optics and Scanning Near-Field Optical Microscopy --; 7.1 Nano-optics: Optics of Nanometer-Size Structures --; 7.2 Experimental Work --; 7.3 Plasmons and Spectroscopic Effects --; 7.4 Imaging by SNOM --; 7.5 Discussion, Outlook, Conclusions --; References --; 8. Surface Modification with a Scanning Proximity Probe Microscope --; 8.1 Overview --; 8.2 Microfabrication with a Scanning Probe Microscope --; 8.3 Investigation of the Fabrication Process --; 8.4 Review of SXM Lithography --; References.

Text of Note

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Togehter, the two volumes give a comprehensive account of experimental aspcets of STM. They provide essentialreading and reference material for all students and researchers involvedin this field.

Cytology.

Physical organic chemistry.

Physics.

Class number

Book number

edited by Roland Wiesendanger, Hans-Joachim Güntherodt.

Hans-Joachim Güntherodt

Roland Wiesendanger

Electronic name

[Book]

Y