(XVIII, 378 p. 192 illustrations, 70 illustrations in color.)
SERIES
Series Title
Springer Series in Optical Sciences, 176.
CONTENTS NOTE
Text of Note
Theoretical Background --; Instrumentation and Methodology --; Bulk and Surface Sensitivity of Photoelectron Spectroscopy --; Examples of Angle Integrated Photoelectron Spectroscopy --; Angle-Resolved Photoelectron Spectroscopy in HV-regions --; High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems --; Very Low Photon Energy Photoelectron Spectroscopy --; Inverse Photoemission --; Photoelectron Diffraction --; Complementary Techniques for Studying Bulk Electronic Structures --; Surface Spectroscopy by Scanning Tunneling Microscope.