Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials
General Material Designation
[Book]
First Statement of Responsibility
by Y. Waseda.
EDITION STATEMENT
Edition Statement
1st ed. 1984
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Berlin, Heidelberg
Name of Publisher, Distributor, etc.
Springer Berlin Heidelberg : Imprint: Springer
Date of Publication, Distribution, etc.
1984
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
(vi, 183 p. ) ill.
SERIES
Series Title
Lecture notes in physics, 204.; Lecture notes in physics, 204.
GENERAL NOTES
Text of Note
Includes index.
CONTENTS NOTE
Text of Note
A brief background of the present requirement for structural characterization of disordered materials --; Fundamental relationships between rdf and scattering intensity --; Definition of partial structure factors and compositional short range order (CSRO) --; Experimental determination of partial structural functions --; Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials --; Theoretical aspects on the anomalous dispersion factors of x-rays --; Experimental determination of the anomalous dispersion factors --; Selected examples of structural determination using anomalous (resonance) x-ray scattering --; Relative merits of anomalous x-ray scattering and its future prospects.