عنوان

Frontiers in statistical quality control

(Number (ISBN

3790816876

(Number (ISBN

9783790816877

Number

b550452

Title Proper

Frontiers in statistical quality control

General Material Designation

[Book]

First Statement of Responsibility

edited by H.-J. Lenz, G.B. Wetherill, and P.-Th. Wilrich.

Place of Publication, Distribution, etc.

Würzburg

Name of Publisher, Distributor, etc.

Physica-Verlag

Date of Publication, Distribution, etc.

1981

Specific Material Designation and Extent of Item

(294 pages) : illustrations

Text of Note

Cover --;Contents --;PART 1: GENERAL ASPECTS OF SQC METHODOLOGY --;How Some IS0 Standards Complicate Quality Improvement --;PART 2: ON-LINE CONTROL --;2.1 Sampling Plans --;Optimal Two-Stage Sequential Sampling Plans by Attributes --;Three-Class Sampling Plans: A Review with Applications --;2.2 Control Charts --;CUSUM Control Schemes for Multivariate Time Series --;The Art of Evaluating Monitoring Schemes --;How to Measure the Performance of Control Charts --;Misleading Signals in Joint Schemes for μ and σ --;The Frechet Control Charts --;Reconsidering Control Charts in Japan --;Control Charts for the Number of Children Injured in Traffic Accidents --;A New Perspective on the Fundamental Concept of Rational Subgroups --;Economic Advantages of CUSUM Control Charts for Variables --;Choice of Control Interval for Controlling Assembly Processes --;Generalization of the Run Rules for the Shewhart Control Charts --;2.3 Monitoring --;Robust On-Line Turning Point Detection. The Influence of Turning Point Characteristics --;Specification Setting for Drugs in the Pharmaceutical Industry --;Monitoring a Sequencing Batch Reactor for the Treatment of Wastewater by a Combination of Multivariate Statistical Process Control and a Classification Technique --;PART 3: OFF-LINE CONTROL --;Data Mining and Statistical Control --;A Review and Some Links --;Optimal Process Calibration under Nonsymmetric Loss Function --;The Probability of the Occurrence of Negative Estimates in the Variance Components Estimation by Nested Precision Experiments --;Statistical Methods Applied to a Semiconductor Manufacturing Process --;An Overview of Composite Designs Run as Split-Plots --;Last Page.

Qualité -- Contrôle.

Quality control -- Statistical methods.

Sampling (Statistics)

edited by H.-J. Lenz, G.B. Wetherill, and P.-Th. Wilrich.

G Barrie Wetherill

Hans-Joachim Lenz

P -Th Wilrich

Electronic name

[Book]

Y