proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
First Statement of Responsibility
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, Ohio :
Name of Publisher, Distributor, etc.
ASM International,
Date of Publication, Distribution, etc.
c2007
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xvi, 356 p. :
Other Physical Details
ill. :
Dimensions
28 cm. +
Accompanying Material
1 CD-ROM
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index
PARALLEL TITLE PROPER
Parallel Title
Thirty-third International Symposium for Testing and Failure Analysis
Parallel Title
33rd International Symposium for Testing and Failure Analysis
Parallel Title
Proceedings of the 33rd International Symposium for Testing and Failure Analysis
TOPICAL NAME USED AS SUBJECT
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
International Symposium for Testing and Failure Analysis(33rd :2007 :, San Jose, Calif.)