Aberration-corrected analytical transmission electron microscopy /
General Material Designation
[Book]
First Statement of Responsibility
edited by Rik Brydson.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Chichester, West Sussex, U.K. :
Name of Publisher, Distributor, etc.
RMS-Wiley,
Date of Publication, Distribution, etc.
2011.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xv, 280 p. :
Other Physical Details
ill. ;
Dimensions
24 cm.
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
SUMMARY OR ABSTRACT
Text of Note
"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--
Text of Note
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--