conference proceedings from the 30th International Symposium for Testing and Failure Analysis, 14-18 November 2004
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, Ohio :
Name of Publisher, Distributor, etc.
ASM International,
Date of Publication, Distribution, etc.
2004
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 computer optical disc :
Other Physical Details
col. ;
Dimensions
4 3/4 in
MATERIAL SPECIFIC AREA: ELECTRONIC RESOURCE CHARACTERISTICS
Designation and extent of file
Electronic data
GENERAL NOTES
Text of Note
Title from disc label
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index
SUMMARY OR ABSTRACT
Text of Note
Contains complete text of the conference proceedings
SYSTEM REQUIREMENTS NOTE (ELECTRONIC RESOURCES)
Text of Note
System requirements (Macintosh): Power PC processor; 64MB of RAM; Mac OS 8.6, 9.0.4, 9.1 or Mac OS X; 24MB of available hard-disk space, additional 70MB of hard-disk space for Asian fonts (optional); CD-ROM drive
Text of Note
System requirements (Windows): IBM PC or compatible with Pentium class processor; 64MB of RAM; Windows 98 2nd edition, Windows Millennium edition, Windows NT 4.0 with Service Pack 5 or 6 (Service Pack 6 recommended), Windows 2000, Windows XP Professional or Home Edition; 30MB of available hard disk space (an additional 60MB is needed temporarily during installation), additional 70MB of hard-disk space for Asian fonts (optional); CD-ROM drive
PARALLEL TITLE PROPER
Parallel Title
Proceedings of the 30th International Symposium for Testing and Failure Analysis, 14-18 November 2004
Parallel Title
Conference proceedings from the 30th International Symposium for Testing and Failure Analysis
TOPICAL NAME USED AS SUBJECT
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7871
Book number
.
I48
2004
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
International Symposium for Testing and Failure Analysis(30th :2004 :, Worcester, Mass.)