proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
First Statement of Responsibility
sponsored by EDFAS
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, Ohio :
Name of Publisher, Distributor, etc.
ASM International,
Date of Publication, Distribution, etc.
2003
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xviii, 518 p. :
Other Physical Details
ill. ;
Dimensions
28 cm. +
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index
PARALLEL TITLE PROPER
Parallel Title
Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003
COVER TITLE
Cover Title
Conference proceedings from the 29th International Symposium for Testing and Failure Analysis
TOPICAL NAME USED AS SUBJECT
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
International Symposium for Testing and Failure Analysis(29th :2002 :, Santa Clara, Calif.)