Direct electron detectors / Greg McMullan, Abdul R. Faruqi and Richard Henderson -- Specimen behavior in the electron beam / Robert M. Glaeser -- Specimen preparation for high-resolution cryo-EM / Lori A. Passmore and Christopher J. Russo -- Strategies for automated cryoEM data collection using direct detectors / Anchi Cheng, Yong Zi Tan, Venkat Dandey, Clinton S. Potter and Bridget Carragher -- Processing of cryo-EM movie data / Zev A. Ripstein and John L. Rubinstein -- Processing of structurally heterogeneous cryo-EM data in RELION / Sjors H.W. Scheres -- Single-particle refinement and variability analysis in EMAN2.1 / Steven J. Ludtke -- Frealign: an exploratory tool for single-particle cryo-EM / Nikolaus Grigorieff -- Testing the validity of single-particle maps at low and high resolution / Peter B. Rosenthal -- Tools for model building and optimization into near-atomic resolution electron cryo-microscopy density maps / Frank DiMaio and Wah Chiu -- Refinement of atomic structures against cryo-EM Maps / Garib N. Murshudov -- Cryo-EM structure determination using segmented helical image reconstruction / Simon A. Fromm and Carsten Sachse -- Cryo-electron tomography and subtomogram averaging / William Wan and John A.G. Briggs -- High-resolution macromolecular structure determination by MicroED, a cryo-EM method / J.A. Rodriguez and T. Gonen -- Databases and archiving for cryoEM / A. Patwardhan and C.L. Lawson