عنوان

Field guide to interferometric optical testing

(Number (ISBN

0819478253

(Number (ISBN

9780819478252

Erroneous ISBN

0819465100

Erroneous ISBN

9780819465108

Number

dltt

Title Proper

Field guide to interferometric optical testing

General Material Designation

[Book]

First Statement of Responsibility

Eric P. Goodwin, James C. Wyant.

Place of Publication, Distribution, etc.

Bellingham, Wash. :

Name of Publisher, Distributor, etc.

SPIE,

Date of Publication, Distribution, etc.

2006.

Specific Material Designation and Extent of Item

1 online resource (xii, 100 p. :

Other Physical Details

ill.)

Series Title

SPIE field guides ;

Volume Designation

v. FG10

Text of Note

Includes bibliographical references (p. 93-96) and index.

Text of Note

Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interferograms -- Newton's rings -- Twyman-Green interferometer -- Compensating plate -- PBS-based Twyman-Green interferometer -- Laser-based Fizeau -- Mach-Zehnder interferometer -- Beam testing -- Lateral shear interferometry -- Rotating grating LSI -- Radial shear interferometer -- Interferograms -- Wavefront aberration coefficients -- Zernike polynomials -- RMS wavefront error -- Spherical aberration interferograms -- Astigmatism interferograms -- Interferograms-other aberrations -- Moiré -- Moiré and interferograms -- Phase-shifting interferometry -- Direct phase measurement -- Methods for phase shifting -- Continuous phase shifting -- Liquid crystal retarder -- Phase shifting algorithms -- Basic phase Unwrapping -- Phase-stepping vs. phase-ramping -- Errors in PSI -- Quantization errors -- Incorrect phase shift -- Avoiding vibrations -- Spatial synchronous and Fourier methods -- Spatial carrier interferometry -- Ground glass -- Surface microstructure -- Nomarski interference microscope -- Fringes of equal chromatic order (FECO) -- Phase-shifting interference microscope -- Multiple-wavelength interferometer.

Text of Note

Vertical scanning techniques -- Flat surface testing -- Mirrors : continued -- Windows : continued -- Prisms -- Corner cubes -- Curved surface testing -- Testing curved surfaces-test plate -- Curved surfaces : Twyman-Green -- Curved surfaces : laser-based Fizeau -- Testing lenses or lens systems -- Shack cube interferometer -- Scatterplate interferometer -- Phase-shifting scatterplate interferometer -- Long-wavelength interferometry -- Smartt point diffraction interferometer -- Phase shifting a PDI -- Sommargren diffraction interferometer -- Curved surfaces, VSWLI -- Absolute measurements -- Absolute measurements : flats -- Absolute measurements : spheres -- Asphere testing -- Aspheric surfaces -- Aspheric testing -- Hyperboloid null tests -- Offner null -- Holographic null optics -- CGH basics -- CGH design guidelines -- Non-null tests -- Reverse raytracing -- Sub-Nyquist interferometry -- Long-wavelength interferometry -- Appendices -- Non-Interferometric testing -- Foucault (knife-edge) test -- Ronchi test -- Equation summary -- Bibliography -- Index.

0

8

Text of Note

A distillation of Dr. Wyant's course at the University of Arizona, this Field Guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, flat and curved surface testing, and absolute measurements.

International Standard Book Number

0819465100

Parallel Title

Guide to interferometric optical testing

Parallel Title

Interferometric optical testing

Interferometry.

Optical instruments-- Testing.

Goodwin, Eric P.

Wyant, James C.

Society of Photo-optical Instrumentation Engineers.

Date of Transaction

20110502100109.0

Electronic name

[Book]

Y