conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
First Statement of Responsibility
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, Ohio :
Name of Publisher, Distributor, etc.
ASM International,
Date of Publication, Distribution, etc.
2011.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xix, 456 p. :
Other Physical Details
col. ill.
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
REPRODUCTION NOTE
Text of Note
Access may be limited to ebrary affiliated libraries.
TOPICAL NAME USED AS SUBJECT
Electronic apparatus and appliances-- Testing, Congresses.
Electronics-- Materials-- Testing, Congresses.
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7871
Book number
.
I58
2011eb
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
International Symposium for Testing and Failure Analysis(37th :2011 :, San Jose, Calif.)