عنوان
پدید آورنده
موضوع
رده
TK7871 .M52 2011eb
TK7871
.
M52
2011eb
کتابخانه
محل استقرار
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
1613447590 (electronic bk.)
(Number (ISBN
1615037268 (electronic bk.)
(Number (ISBN
9781613447598 (electronic bk.)
(Number (ISBN
9781615037261 (electronic bk.)
Erroneous ISBN
161503725X
Erroneous ISBN
9781615037254
Erroneous ISBN
9781615037261 (e-book)
NATIONAL BIBLIOGRAPHY NUMBER
Number
dltt
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Microelectronics failure analysis
General Material Designation
[Book]
Other Title Information
desk reference /
First Statement of Responsibility
edited by Richard J. Ross ; EDFAS, ASM International.
EDITION STATEMENT
Edition Statement
6th ed.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, Ohio :
Name of Publisher, Distributor, etc.
ASM International,
Date of Publication, Distribution, etc.
c2011.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource (xi, 660 p.) :
Other Physical Details
ill.
GENERAL NOTES
Text of Note
"ASM International, 2011, no. 09110Z"--P. 4 of cover.
Text of Note
Some online versions lack accompanying media packaged with the printed version.
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and indexes.
CONTENTS NOTE
Text of Note
Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
0
OTHER EDITION IN ANOTHER MEDIUM
Title
Microelectronics failure analysis.
International Standard Book Number
161503725X
PARALLEL TITLE PROPER
Parallel Title
Microelectronics failure analysis desk reference.
TOPICAL NAME USED AS SUBJECT
Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc.
Electronics-- Materials-- Defects, Handbooks, manuals, etc.
Electronics-- Materials-- Testing, Handbooks, manuals, etc.
Microelectronics-- Defects-- Testing, Handbooks, manuals, etc.
Microelectronics-- Materials-- Testing, Handbooks, manuals, etc.
DEWEY DECIMAL CLASSIFICATION
Number
621
.
381
Edition
23
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK7871
Book number
.
M52
2011eb
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Ross, Richard J.
CORPORATE BODY NAME - ALTERNATIVE RESPONSIBILITY
ASM International.
Electronic Device Failure Analysis Society.
Knovel (Firm)
ORIGINATING SOURCE
Date of Transaction
20131119112625.0
ELECTRONIC LOCATION AND ACCESS
Electronic name
مطالعه متن کتاب [Book]
Y
