edited by H. J. Güntherodt, D. Anselmetti, E. Meyer.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Dordrecht :
Name of Publisher, Distributor, etc.
Imprint: Springer,
Date of Publication, Distribution, etc.
1995.
SERIES
Series Title
NATO ASI Series, Series E: Applied Sciences,
Volume Designation
286
ISSN of Series
0168-132X ;
SUMMARY OR ABSTRACT
Text of Note
The invention of scanning tunneling microscopy, atomic force microscopy and near field optical microscopy has opened up a new field of research: scanning probe methods (SMP). The quality of image acquisition has made great strides in recent times, but many fundamental, unsolved problems remain unanswered about the interaction between probe tip and sample. Forces in Scanning Probe Methods contains 60 contributions dedicated to these problems. Most of the contributions are reviews, presenting condensed, relevant information, suitable for both students and specialists. The contributions cover the instrumental aspects and design of force microscopes in different environments (ambient pressure, low temperature, ultrahigh vacuum, liquids). Theory is also covered, including ab initio calculations and molecular dynamics simulations. Mechanical properties at micro and nanoscales receive intensive treatment, including adhesion, friction and wear: the friction phenomenon is one of the most hotly debated questions. Other highlights include advances in near field optical microscopy and its relation to forces, the application of force microscopy in NMR, and the observance of flux lines in high Tc superconductors. Recent advances in biology and chemistry also attract attention.
OTHER EDITION IN ANOTHER MEDIUM
International Standard Book Number
9789401040273
PIECE
Title
Springer eBooks
PARALLEL TITLE PROPER
Parallel Title
Proceedings of the NATO Advanced Study Institute, Schluchsee, Germany, March 7--18, 1994