عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9783642556159
(Number (ISBN
9783642627224
NATIONAL BIBLIOGRAPHY NUMBER
Number
b407312
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Point Defects in Semiconductors and Insulators
General Material Designation
[Book]
Other Title Information
Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions /
First Statement of Responsibility
by Johann-Martin Spaeth, Harald Overhof.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Berlin, Heidelberg :
Name of Publisher, Distributor, etc.
Imprint: Springer,
Date of Publication, Distribution, etc.
2003.
SERIES
Series Title
Springer Series in Materials Science,
Volume Designation
51
ISSN of Series
0933-033X ;
CONTENTS NOTE
Text of Note
Introduction -- Fundamentals of Electron Paramagnetic Resonance -- Electron Paramagnetic Resonance Spectra -- Optical Detection of Electron Paramagnetic Resonance -- Electron Nuclear Double Resonance -- Analysis of ENDOR Spectra -- Electrical Detection of Electron Paramagnetic Resonance -- Theoretical ab initio Calculations of Hyperfine Interactions -- Experimental Aspects of Optically Detected EPR and ENDOR -- Appendices.
0
SUMMARY OR ABSTRACT
Text of Note
This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (the latter is known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view with many illustrative examples taken from semiconductors and insulators. The non-specialist is informed about the potential of the different methods. A researcher finds practical help in the application of commercial apparatus as well as useful guidance from ab initio theory for the task of deriving structure models from experimental data.
OTHER EDITION IN ANOTHER MEDIUM
International Standard Book Number
9783642627224
PIECE
Title
Springer eBooks
TOPICAL NAME USED AS SUBJECT
Optical materials.
PERSONAL NAME - PRIMARY RESPONSIBILITY
Spaeth, Johann-Martin.
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Overhof, Harald.
CORPORATE BODY NAME - ALTERNATIVE RESPONSIBILITY
SpringerLink (Online service)
ORIGINATING SOURCE
Date of Transaction
20190307161000.0
ELECTRONIC LOCATION AND ACCESS
Electronic name
مطالعه متن کتاب [Book]
Y
