عنوان

Atomic Force Microscopy/Scanning Tunneling Microscopy

(Number (ISBN

9781475793222

(Number (ISBN

9781475793246

Number

b403911

Title Proper

Atomic Force Microscopy/Scanning Tunneling Microscopy

General Material Designation

[Book]

First Statement of Responsibility

edited by Samuel H. Cohen, Mona T. Bray, Marcia L. Lightbody.

Place of Publication, Distribution, etc.

Boston, MA :

Name of Publisher, Distributor, etc.

Imprint: Springer,

Date of Publication, Distribution, etc.

1994.

Text of Note

KEYNOTE ADDRESS: Materials Research Instrumentation Development: A New Paradigm -- Biological Nanostructure -- Scanning Force Microscopy on Living Virus-Infected Cells -- Scanning Probe Microscopy Imaging and Characterization of Biological Structures from Biomolecules to Living Cells -- Resolution and Limitations in Biological Applications of Atomic Force Microscopy -- Scanning Tunneling Microscopy Imaging of Biomolecules: I. Tubulin in Microtubules and Monolayers II. Bacterial Luciferase-A Model System for Anesthesia -- Scale-Area Analysis of Scanning Tunneling Microscopy/Atomic Force Microscopy Data by the Patchwork Method -- Imaging Matrix Materials and Fundamental Lamellae Structure of Biogenic Aragonite -- Atomic Force Microscopy Images of Starch Polymer Crystalline and Amorphous Structures -- Scanning Tunneling Microscopy Studies on Xanthan Gum -- Atomic Force Microscopic Imaging of Biomineral Powder Samples Formed by Deposits from Ethanolic Suspensions -- Nanostructure of Materials -- Scanning Tunneling Microscopy Studies of Fullerene C60 -- Scanning Tunneling Microscopy Studies of Alcohol/Alkane Mixtures Adsorbed on Graphite Surfaces -- Fracture Surface Topography of TNT Using Atomic Force Microscopy -- Scanning Tunneling Microscopy and Spectroscopy of Carbon Nanotubes -- Scanning Tunneling Microscopy and Atomic Force Microscopy Investigations on Organic Material Thin Films and Adsorbate Particles in Air -- Image Contrast Mechanisms and Topology of Polyethylene Single Crystals: Low-Voltage, High-Resolution Scanning Electron Microscopy and Atomic Force Microscopy -- Examination of Plain Carbon Steels Using an Atomic Force Microscope -- Scanning Tunneling Microscopy of Porous Silicon-Based Surfaces -- Atomic Force Microscope Study of Ferroelastic Domains -- Atomic Scale Imaging of Minerals with the Atomic Force Microscope -- Scanning Tunneling Microscopy of the Structural and Electronic Properties of Chemical-Vapor Deposited Diamond Films -- Combined Scanning Tunneling Microscope and Quartz Microbalance Study of Molecularly Thin Water Layers -- Atomic Force Microscopy of Polymer Droplets -- Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Conducting Polymer Films -- Morphological Features of Polyethylene and Polyimides by Atomic Force Microscopy -- Studies of High Performance Fibers by Atomic Force Microscopy and Molecular Simulation -- Atomic Force and Electron Microscopic Investigations of Lead Selenide Crystals Grown under Monolayers -- Atomic Force Microscopy Studies of Ultra-Thin Films of Cadmium Phosphide Nanoclusters on Mica -- Comparative Study of the Surface Roughness of Oxide Thin Films -- Methodologies and Techniques -- Applications of a Combined Scanning Tunneling Microscope and Quartz Microbalance -- Surface Science at the Nanoscale: Molecular Imaging and Surface Forces -- Linearity and Calibration of Scanning Probe Microscope Images -- Sample Holders for Imaging Intact Particles with the Scanning Force Microscope -- Scanning Tunneling Microscopy of Freeze Fracture Replicas of Biomaterials -- The Scanning Probe Microscope as a Metrology Tool -- Use of Atomic Force Microscopy in the Determination of Image Contrast in Microtomed Samples of Thermotropic Liquid Crystals -- Photon Tunneling Microscopy of Polymers -- Morphology and Molecular Ordering of Langmuir-Blodgett and Self-Organized Films from Organic Compounds -- PT/IR Nanotips-A Mechanical Technique for Sharpening Tips Utilized by a Scanning Tunneling Microscope -- Atomic Force Microscopy Study of Electron Beam Patterned SiO2 -- Measuring the Mechanical Properties of Preformed, Nanometer-Size Gold Clusters with the Atomic Force Microscope -- Analysis and Interpretation of Scanning Tunneling Microscopy Images in an Electrochemical Environment: Copper on AU(111) -- A Closed-Loop Optical Scan Correction System for Scanning Probe Microscopes -- Vibrating Probe (AC) Methods in Atomic Force Microscopy.

0

International Standard Book Number

9781475793246

Title

Springer eBooks

Analytical biochemistry.

Microscopy.

Surfaces (Physics).

Cohen, Samuel H.

Bray, Mona T.

Lightbody, Marcia L.

SpringerLink (Online service)

Date of Transaction

20190301074400.0

Electronic name

[Book]

Y